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Spatial point patterns analysis.

Perform first- and second-order multi-scale analyses derived from Ripley K-function, for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with tests of statistical significance based on Monte Carlo simulations.

Maintainer: Raphael Pelissier
Author(s): R. Pelissier and F. Goreaud

License: GPL-2

Uses: ade4, spatstat

Released over 5 years ago.