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Spatial point patterns analysis.

Perform first- and second-order multi-scale analyses derived from Ripley's K-function, for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with test of statitical significance based on Monte Carlo simulations.

Maintainer: Raphael Pelissier
Author(s): R. Pelissier and F. Goreaud

License: GPL2

Uses: Does not use any package

Released almost 12 years ago.